Technology Key Report

A005 Most Cited Patents

View the top records that have been cited most frequently by other records to understand which records are more prolific and have had their technology built upon by others. These patents are likely to be more influential and may represent the core, innovative technology of the organization it represents. Returns at most Top 10 patent information.

get/insights/most-cited

Request

Query parameters

apply_end_timestring

Patent apply date to, format:yyyy

Example:2020
apply_start_timestring

Patent apply date from, format:yyyy

Example:2010
authoritystring

Select the authority of the patent, the default query all databases, eg CN、US、EP、JP. To find more information, refer to https://analytics.zhihuiya.com/status. Example: US OR EP

Example:CN
ipcstring

Patent IPC classification

Example:B66B11
keywordsstring

Searches for keywords within patent title and summary. Supports AND, OR, NOT search logic, for example "mobile phone AND (screen OR battery)".

Example:car
public_end_timestring

Patent publication date to, format:yyyy

Example:2020
public_start_timestring

Patent publication date from, format:yyyy

Example:2010
query_textstring

Enter the Analytics Query, with a maximum length of 800 characters and cannot contain complex wildcards such as $W $PRE $WS $SEN $PARA $FREQ .etc

Example:TACD: virtual reality

Response

Successful a005 most cited patents response.

statusboolean required

Status

error_msgstring

Error Message

error_codeinteger required

Error Code

Example response

{
  "data": [
    {
      "count": 3,
      "title": "RFID applications",
      "patent_id": "dd194043-93a3-467c-839c-b00d06273595",
      "patent_num": "US8410617B2"
    }
  ],
  "error_msg": "The request parameter format is incorrect!"
}

Changes

No recorded changes to this operation across all 1 revision of this API.